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Methods, Problems and Solutions

Rietveld R and fit factors, Refining on R-Bragg, and Powder Calibration Standards for INEL PSD (Position Sensitive Detector)

The CCP14 Homepage is at http://www.ccp14.ac.uk

[Problems and Solutions]
[Rietveld R and fit factors] | [Errors and Rietveld R Factors] | [ESDs, Probable Error and Rietveld Analysis]
[Calibration standards for Powder Diffraction] | [Diffconv - INEL PSD Spline based Data Calibration]

August 1997 Rietveld Mailing List Discussion Resurrected due to difficulty in finding the Jean-Francois Berar et al reference mentioned below

J. F. Berar and P. Lelann, J.Appl.Cryst. 24 (1991) p1-5

The full title of this is:

"ESDs and estimated probable-error obtained in rietveld refinements with local correlations" J.F. Berar and P. Lelann, Journal of Applied Crystallography, 1991, Vol.24, No.Pt1, pp.1-5.

Papers that can be referred to:

Hugo Rietveld - Rietveld Method Web-site


Date: Fri, 08 Aug 1997 13:34:13 +1000
To: "Rietveld Users Mailing List" [[email protected]]
From: Lachlan Cranswick [[email protected]]
Subject: RIET USERS: Query on Validity of Rietveld Bragg R


Hi All,

Potentially silly queries.

Are there any newish references around the place about the
validity of R Bragg in Rietveld analysis.

---

Also, when using capilliary data from such machines as an
INEL PSD.  You can get quite nice Bragg R's purely becuase
20% to 80% of the intensity that is being fitted relates to
the background.  Thus are there any background subtracted 
versions for Rietveld of Bragg R referenced in the literature?

Thanks in advance.

Lachlan.

Lachlan Cranswick  - Melbourne, Australia                    _--_|\  
Phone/Fax : (613) 9455-1345                                 /      \
E-mail : [email protected]                              \_.--._/
Mobile Phone/Voice Mail : 0412-1141-31                            v
Crystallographic WWW : http://www.unige.ch/crystal/stxnews/stx/volnteer.htm 


Date: Fri, 8 Aug 1997 09:35:35 +0200
To: RIETVELD_L Distribution List [[email protected]]
From: "Alan Hewat, ILL Grenoble" 
Subject: Re: RIET USERS: Query on Validity of Rietveld Bragg R

 Lachlan Cranswick [[email protected]] wrote 8 August 1997:

>Potentially silly queries.
>Are there any newish references around the place about the
>validity of R Bragg in Rietveld analysis.

R-Bragg is of course not minimised in Rietveld refinement, 
and is only an indication of the fit, for users more familiar 
with single crystal refinements.

>Also, when using capilliary data from such machines as an
>INEL PSD.  You can get quite nice Bragg R's purely becuase
>20% to 80% of the intensity that is being fitted relates to
>the background.  Thus are there any background subtracted 
>versions for Rietveld of Bragg R referenced in the literature?

It was true that some profile-R's defined to include the fit to
the background eg in the DBW program, gave spuriously low 
values for this kind of reason - especially low R's for high 
B/G's :-) but Bragg-R refers to integrated line intensities, 
and should not be affected in the same way.  And why should
it be any different for INEL PSD data ?

Low R-factors can also be obtained with low resolution or
truncated data, which can be fitted very well without 
necessarily resulting in a good structure.

BTW, if people would like to subscribe to the neutron scattering
mailing list to receive directly mails about NEXUS and other 
things, see  http://www.neutron.anl.gov/mailing_list.html

Alan.

Alan Hewat, ILL Grenoble, FRANCE  tel (33) 4.76.20.72.13 
ftp://ftp.ill.fr/pub/dif  fax (33) 4.76.48.39.06  http://www.ill.fr/dif/

Date: Fri, 8 Aug 1997 16:48:17 +0200 (MET-DST)
To: [email protected]
CC: [email protected]
Subject: RE: Bragg R

On: Fri, 08 Aug 199 Validity of Rietveld Bragg R
Lachlan Cranswick [[email protected]]
wrote:
>...Are there any newish references around the place about the
>validity of R Bragg in Rietveld ...
>You can get quite nice Bragg R's purely becuase 20% to 80% of the intensity
>that is being fitted relates to the background.  Thus are there any background
>subtracted versions for Rietveld of Bragg R referenced in the literature?

Lachlan,
there was a paper in the early '90ies which treats the problem, I think it was
a french author in J Appl Cryst - helas, I can't specify you more as I am on 
leave from my hardware (paper) file of bibliographic references!
Regards

Miguel Gregorkiewitz
Dip Scienze della Terra, Universita
Via delle Cerchia 3, I-53100 SIENA, Europe
fon +39'577'298823 fax 298815
email [email protected]

From: "Ram SESHADRI" [[email protected]]
Date: Sat, 9 Aug 1997 11:06:35 -0600
To: RIETVELD_L Distribution List [[email protected]]
Subject: 

L. Cranswick:
...Are there any newish references around the place about the
validity of R Bragg in Rietveld ...

Miguel Gregorkiewitz:
there was a paper in the early '90ies which treats the problem, I think it was
a french author in J Appl Cryst - helas, I can't specify you more as I am on
...


          I think the paper Miguel refers to is J. F. Berar and P. Lelann,
J.Appl.Cryst. 24 (1991) p1-5. Berar is the author of the XND program and
XND listings provide as many at least 10 indicators of the fit quality.
However I am not sure that this is the point of a Rietveld analysis...

Cheers

Ram


-- 
Dr. Ram SESHADRI
Anorganische Chemie, Johannes Gutenberg Universitat
BecherWeg 24, Mainz D55099 Germany. Phone(FAX): +49 6131 39 4417(5380)
email/net: [email protected]

Date: Sun, 10 Aug 1997 11:36:14 +0200
To: RIETVELD_L Distribution List [[email protected]]
From: Armel Le Bail [[email protected]]
Subject: Standards, Rietveld Bragg R and background

The Al2O3 NIST SRM 1976 is a relatively good standard
for testing your diffractometer (but LaB6, SRM 660, gives
lower FWHMs). Errors on intensities are mainly due to
the sample itself (not intercepting the whole X-ray beam,
preferred orientation, sample transparency, etc). So that I
recommend the SRM 1976, if the data are treated with the Le
Bail method, an option which should be included in any good
Rietveld program. With this option, you will obtain a fit as if
the structure had been perfect (Bragg R ~ 0.0), so that the
Rp and Rwp will be as low as possible. One advantage of
SRM 1976 is its compacted plate form.

Another standard which has already been discussed on this
list is NAC (NaCa2Al3F14), frequently used on the INEL
120 PSD for calibration. The main inconvenient is its cost.
The producer (which is in my lab) sells it for a price larger
than gold itself (but lower than diamond :-)...

About the background influence on Rp and Rwp, it seems
to me that the original Rietveld program gave exclusively the
"background subtracted" and "peak only" profile R factors
so that they are now called the "conventional Rietveld Rp and
Rwp factors".

Then, if I am not wrong, I have one question : who invented the
total Rp and Rwp factors ?-) I suspect that they were invented
by error or just for an endless discussion about their absence of
meaning regarding the crystal structure...

Armel Le Bail, back of vacations.

From: [email protected]
Date: Mon, 11 Aug 1997 10:26:35 -0600 (MDT)
To: [email protected]
Subject: RE: Standards, Rietveld Bragg R and background

To all,
In case any one was wondering...

>Then, if I am not wrong, I have one question : who invented the
>total Rp and Rwp factors ?-) I suspect that they were invented
>by error or just for an endless discussion about their absence of
>meaning regarding the crystal structure...

These things were originally described by Hugo Rietveld. Rpw in particular is 
statistically "unassailable" as it is directly linked to the function that is 
minimized in a Rietveld Refinement.

Bob Von Dreele

Date: Tue, 12 Aug 1997 15:42:45 +1000
To: RIETVELD_L Distribution List [[email protected]]
From: Ian Madsen [[email protected]]
Subject: Re: Standards etc
Reply-To: RIETVELD_L Distribution List [[email protected]]

Armel Le Bail has mentioned the use of NAC for calibration of the INEL PSD -
we had problems in obtaining this material - not to mention the cost. We
have decided to use Y2O3 (thanks to Bob Roth of NIST for the suggestion)
since it has a peak roughly every degree in the upper part of the pattern -
peaks start at about 17deg, so a low angle standard may be required as well.
Y2O3 is readily available (ours is Alrich 99.99% gold label) at a reasonable
cost. You may need to heat the material to ensure that crystallite size is
as large as possible - we heat at 1200C for a few days - this makes a small,
but observable, difference to the peak widths.



At 11:36 AM 10/8/97 +0200, you wrote:
>
>Another standard which has already been discussed on this
>list is NAC (NaCa2Al3F14), frequently used on the INEL
>120 PSD for calibration. The main inconvenient is its cost.
>The producer (which is in my lab) sells it for a price larger
>than gold itself (but lower than diamond :-)...
>
>
>Armel Le Bail, back of vacations.
>
>

Cheers

****   WE HAVE MOVED - PLEASE NOTE CHANGE OF ADDRESS   ****


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     Phone  +61 3 9545 8785  direct
            +61 3 9545 8500  switch
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Date: Tue, 12 Aug 1997 11:48:59 +0200
To: RIETVELD_L Distribution List [[email protected]]
From: Armel Le Bail [[email protected]]
Subject: RE: Standards, Rietveld Bragg R and background

At 10:26 11/08/1997 -0600, Bob Vob Dreele wrote:

>In case any one was wondering...
>>Then, if I am not wrong, I have one question : who invented the
>>total Rp and Rwp factors ?-) I suspect that they were invented
>>by error or just for an endless discussion about their absence of
>>meaning regarding the crystal structure...
>These things were originally described by Hugo Rietveld. Rpw in particular
is 
>statistically "unassailable" as it is directly linked to the function that
is 
>minimized in a Rietveld Refinement.

Yes Bob, sure that Rp and Rwp were originally described by Hugo
Rietveld.

But.

Remember that the background was not originally described by
functions with refinable parameters. So that the function practically
minimized (i.e. in the original softwares) was not including the
background. And this was logical.

Have a look at fig. 4 in J. Appl. Cryst. 2 (1969) 65-71 by H.M.
Rietveld and observe the zero background, a fact which is
certainly not experimental for CaUO4 on any neutron diffractometer.
So that, even if this is not explicitly written in the paper, the yi(obs)
in the Rp formula is in fact Iobs-background. Remember the first
versions were in two steps, one for preparing data and one for
the refinement. The background was subtracted in the first step
(or am I wrong ??). This background corresponded to values 
interpolated between intensities estimated manually at a few
angular values.

So that the "total Rp and Rwp" (i.e. including background and points
where no reflections are contributing) were probably introduced by
those having included the background as described by refinable
parameters. May be it was for ToF data? The question remains
interesting.

If you remove the sample, the background is still there... This is the
best way to explain why the total Rp and Rwp are not a lot related
to the compound structure. The more the background is high and the
more the total Rp and Rwp are low if the background is well fitted :-).
Hence the old (continuing) controversy. I systematically give the
conventional Rp and Rwp in all my manuscripts, indicating that they
are "background subtracted" and "peak only". I never mention the
total Rp and Rwp because their meaning is null for the structure-
related intensities. The problem is that some softwares give only
these meaningless total Rp and Rwp so that their users have no way
to access to the conventional R values (if you want a list of these
softwares, let me know).

So who invented first the "total Rp and Rwp" ?? This don't seems to
be H.M. Rietveld, IMHO. Or maybe the old software I just had a
look inside was not the original ?

Armel

Date: Tue, 12 Aug 1997 14:02:00 +0200
To: RIETVELD_L Distribution List [[email protected]]
From: "Alan Hewat, ILL Grenoble" [[email protected]]
Subject: RE: Standards, Rietveld Bragg R and background

Armel Le Bail  wrote 12 Aug 1997:

>So who invented first the "total Rp and Rwp" ?? This don't seems to
>be H.M. Rietveld, IMHO.

As I said earlier, it seems to have been introduced in the early 
versions of the DBWS program; for the same data and the same 
structure parameters, this resulted in lower R-factors.

Including the background in the refinement and R-factors is not wrong
en principe.  It is just that some users naively believe that a low 
R-factor implies a good structure :-)  But you can also obtain a low 
R-factor, without having a good structure, by fitting low resolution 
data, or data that is not sensitive to some of the structure parameters 
(eg light atom positions with X-ray data).

Hugo Rietveld didn't include the background in the definition of the
profile R-factors, and that choice IMHO appears to be the best.  He did
correctly include the background in calulating the statistical error for 
each point (the weighting scheme), and he did correctly calculate the 
estimated errors in the parameters. That is much more important than 
simply obtaining "low R-factors".

>The problem is that some softwares give only
>these meaningless total Rp and Rwp so that their users have no way
>to access to the conventional R values (if you want a list of these
>softwares, let me know)

Go ahead Armel, reveal all :-)

Alan Hewat, ILL Grenoble, FRANCE  tel (33) 4.76.20.72.13 
ftp://ftp.ill.fr/pub/dif  fax (33) 4.76.48.39.06  http://www.ill.fr/dif/

From: [email protected]
Date: Tue, 12 Aug 1997 8:38:55 -0600 (MDT)
To: [email protected]
Subject: Re: Standards etc

Ian,

>You may need to heat the material to ensure that crystallite size is
>as large as possible - we heat at 1200C for a few days - this makes a small,
>but observable, difference to the peak widths.

I suggest that you actually are removing microstrains in the material by heating; 
not making the particles bigger. Did the stuff sinter at all at 1200C? We use CaF2 
as a neutron diffractometer calibrant after heating; there it definitely removes 
microstrains and leaves a little remaining peak broadening which is due to particle 
size.

Bob Von Dreele

From: [email protected]
Date: Tue, 12 Aug 1997 9:02:39 -0600 (MDT)
To: [email protected]
Subject: RE: Standards, Rietveld Bragg R and background

Armel (and others),
> The problem is that some softwares give only
> these meaningless total Rp and Rwp.

I beg to differ. The function minimized by the least squares in a Rietveld 
refinement is M=sum[w(Io-Ic)^2] and Rwp is defined as sqrt{M/sum[w(Io)]}. Nothing 
is more clear than that. The other residuals are interesting and sometimes useful 
for characterizing how this residual is distributed between Bragg intensities and 
background but they are not directly related to the minimization function. The 
subtracted background R is "flawed" because it assumes that all the random error in 
the measurements belongs to the Bragg contribution and that the (subtracted) 
background contribution has none. Thus, it is a over estimate of the contribution 
to the residual from the Bragg intensities. I think that the real point in all this 
is that R-value comparisions between different classes of diffraction experiments 
(x-ray vs neutron TOF, etc.) is particularly meaningless because the differing 
background contributions, scattering factors, Lorentz factors between the 
experiments have such an enormous impact on the quality of the refinement results. 
What really matters is the quality of the structural result (atom positions, 
temperature factors, bond lengths, angles, etc.) and how they compare with other 
known data and not whether Rwp is such-and-such a value.

Bob Von Dreele 

From: "Ram SESHADRI" [[email protected]]
Date: Tue, 12 Aug 1997 09:16:56 -0600
To: RIETVELD_L Distribution List [[email protected]]
Subject: 

Ian Madsen wrote:
> Subject: Re: Standards etc
> Armel Le Bail has mentioned the use of NAC for calibration of the INEL PSD -
> we had problems in obtaining this material - not to mention the cost. We
> have decided to use Y2O3 (thanks to Bob Roth of NIST for the suggestion)
> since it has a peak roughly every degree in the upper part of the pattern -
> peaks start at about 17deg, so a low angle standard may be required as well.
> Y2O3 is readily available (ours is Alrich 99.99% gold label) at a reasonable
> cost.

 Y2O3 is actually a great Rietveld Standard for diffractometers. It's a cube
 about 1 nm on edge with nice lineshapes. What's
 more, with so many labs working on YBa2Cu3O7, its not hard to find.

 Cheers

 Ram

 [email protected]

Date: Tue, 12 Aug 1997 11:34:45 -0400 (EDT)
From: "R. A. Young" [[email protected]]
Subject: R's and background

Dear Armel:

You wrote:        
>So who invented first the "total Rp and Rwp" ?? This don't seems to
>be H.M. Rietveld, IMHO. Or maybe the old software I just had a
>look inside was not the original ?

>Armel

Well, in the late 70's we put a refinable background (polynomial) into our
program which later became DBW* and, later,  DBWS*.   We did not forsee that
this was to bring us opprobrium!

-Ray

R. A. Young, Professor Emeritus
School of Physics
Georgia Institute of Technology
Atlanta, GA 30332 USA
Tel: 404-894-5208
e-mail: [email protected]

From: "Jens Trommer" [[email protected]]
Organization: Institut f. Angew. Chemie Berlin-Adlershof
To: [email protected]
Date: Wed, 13 Aug 1997 11:12:51 -60
Subject: RE: Rietveld Bragg R and background

Dear Bob Von Dreele, Dear Armel Le Bail and all other 
Rietveld Users,

On 12 Aug 97 at 11:48, Armel Le Bail wrote:


> At 10:26 11/08/1997 -0600, Bob Vob Dreele wrote:
> 
> >In case any one was wondering...
> >>Then, if I am not wrong, I have one question : who invented the
> >>total Rp and Rwp factors ?-) I suspect that they were invented
> >>by error or just for an endless discussion about their absence of
> >>meaning regarding the crystal structure...

> 
> Yes Bob, sure that Rp and Rwp were originally described by Hugo
> Rietveld.
> 
> But.
> 
> Remember that the background was not originally described by
> functions with refinable parameters. So that the function practically
> minimized (i.e. in the original softwares) was not including the
> background. And this was logical.
> 
> Have a look at fig. 4 in J. Appl. Cryst. 2 (1969) 65-71 by H.M.
> Rietveld and observe the zero background, a fact which is
> certainly not experimental for CaUO4 on any neutron diffractometer.
> So that, even if this is not explicitly written in the paper, the yi(obs)
> in the Rp formula is in fact Iobs-background. Remember the first
> versions were in two steps, one for preparing data and one for
> the refinement. The background was subtracted in the first step
> (or am I wrong ??). This background corresponded to values 
> interpolated between intensities estimated manually at a few
> angular values.
> 

I just want to confirm Armel Le Bail's remarks about the background 
corrected intensities in H. M. Rietveld's original paper in J. Appl. 
Cryst. 2 (1969), 65-71. It is not only obvious from the plotted patterns 
in Fig. 4 and 5 in addition Hugo Rietveld wrote explicitly in his 
paper in the Section: Experimental about the background corrected 
intensities yi in the form:
yi = Yi - Bi, where Yi is the total intensity at step i and Bi is the 
estimated background as described above and in the paper. The 
equation dealing with the calculation of Rp uses only the corrected 
yi values.  

The easiest way to proof is the original paper by Rietveld which you 
can read without leaving your desk by browsing through the WWW to 
Hugo Rietveld's own homepage at: http://home.pi.net/~rietvld/home.html
or to the location of the paper at: http://chemsg7.tau.ac.il/xtal/paper2/paper2.html

> So who invented first the "total Rp and Rwp" ?? This don't seems to
> be H.M. Rietveld, IMHO. Or maybe the old software I just had a
> look inside was not the original ?
> 

Its an interesting question for me too.

Jens Trommer

Date: Mon, 25 Aug 1997 10:39:11 +0200
To: RIETVELD_L Distribution List [[email protected]]
From: Armel Le Bail [[email protected]]
Subject: RE: Standards, Rietveld Bragg R and background

Bob wrote:
>What really matters is the quality of the structural result (atom positions, 
>temperature factors, bond lengths, angles, etc.) and how they compare with
other 
>known data and not whether Rwp is such-and-such a value.

Hum, Bob, I have just received the CPD Newsletter No18 in which I 
read "The commission is following up the Rietveld refinement comparison
study published by Hill et al in 1994 with a set of recommendations. This is
being led by Lynne McCusker and Bob von Dreele and will probably appear
in one of the IUCr journals this year". So, if I understand well your
point, the R
values do not really matter and this could be your recommendation to let users
propose any definition of R in their manuscript ?

Most Journals give informations to authors. For instance, the J. Solid State
Chem. ask for the "definitions and final values of R factors (weighted and
unweighted) [e.g. RI (RF), Rwp, Rexp, S]". I would add Rp to the list. Only
few of these were provided by the last GSAS version I used. Even RI was
not available. I am sorry but my opinion is that a Rietveld software should
at least provide the Rs as defined by Rietveld (background subtracted). Now
there is no opprobrium to those who want to add other R definitiions
(background included).

I agree with Alan writing :
>Hugo Rietveld didn't include the background in the definition of the
>profile R-factors, and that choice IMHO appears to be the best.  He did
>correctly include the background in calulating the statistical error for 
>each point (the weighting scheme), and he did correctly calculate the 
>estimated errors in the parameters. That is much more important than 
>simply obtaining "low R-factors".

Anyway, I would like to obtain from the CPD some clear recommendations
about which Rp and Rwp should be given. Hearing that the conventional
Rietveld Rp and Rwp values should be given in any case would make me
happy. Hearing that if some want to give additionally the DBW-Young Rp
and Rwp values (background included), this is wellcome too because the ratio 
                          (Rietveld Rp) / (DBW-Young Rp) 
will give an idea about how high was the background. 

In many publications, Rp and Rwp are given without cleardefinition. You may
be sure that peoples will choose to give the DBW-Young R values because
they are systematically lower than the true Rietveld ones. The worst I
have seen is in papers giving only the GoF Chi2 values, which were all near
of 1 and no figure were given showing the observed and calculated patterns.
In fact, Chi2 = 1 could mean that Rwp=35%=Rexp. In such a case, making
another pattern with longer exposure would be the thing to do before
submitting the publication...

Obtaining "low R-factors" may not be very important however,
obtaining "low R-factors" together with "low FWHMs" is significant.
Has somebody an idea for a new R definition including both aspects ?
Imagine a conventional Rietveld Rp = 5% together with FWHM
as low as 0.01 2-theta degrees. How to distinguish this from a result
from another experiment leading to the same Rp but with FWHM=0.15 ??

Last point on the Rietveld Refinement Round Robin. The questionnaire
for structure refinement of PbSO4 asked for the Rp, Rwp, Rexp, GoF
and RB (=RI) definitions (how many participants had indicated if the
background was subtracted or not??) but the form for reporting the
M-ZrO2 refinement results only asked for the R values. Few people
have thought to indicate if the Rp and Rwp values they gave were either
the true Rietveld ones or the DBW-Young ones. Fortunately the
reanalysis provided both Rietveld and DBW-Young Rp and Rwp values.
The recommendation given in the RRRR conclusion was :
   "it is desirable that both types of agreement indices be calculated
and subsequently quoted in published work in order to permit
valid comparisons to be made between instruments with different
PtB ratios and using different wavelengths".

My hope is that the CPD will not recommend now the contrary.
Following the above recommendation, the first you have to do, Bob,
I am afraid, is to include the true Rp and Rwp in GSAS together with
RB :-).

Armel

P.S 1. In 1992, I asked for the compilation on the RRRR PbSO4
results deposited with the British Library Document Supply Center
(supplementary publication No SUP 55098). The document had
108pp, most of them completely white. Probably an electronic
error ?? 

P.S. 2. May I suggest that Rp and Rwp values given in published Rietveld
refinements should be accompanied by the labels :
             "DBW-Young" if including the background
and       "Rietveld"  (or nothing at all) if excluding the background

with no supplementary indication should be the conventional
ones (background subtracted) and that the "background included" values

Date: Thu, 11 Sep 1997 23:45:50 +1000
To: "Rietveld Users Mailing List" [[email protected]]
From: Lachlan Cranswick [[email protected]]
Subject: RIET: Refining on R-Bragg rather than R-Wp???


Hi All,

I just can't seem to keep away from these R-Bragg questions! :-)
(An interesting finding based on the previous discussion is the R-Bragg 
calculation in the software I am using is affected by background 
(thus something dodgy must be going on) while Fullprof seems to be 
doing the right thing and not including background in the calculation 
of the R-Bragg.  Not sure about other software as yet?)

---

Does anyone know the pros and cons of refining of Weighted R-Bragg
instead of  the Weighted Profile (R-Wp)?  Are there any packages
out there that can be toggled to refine on a weighted R-Bragg rather 
than R-Wp?

In the paper by H Boysen (Anharmonic Thermal Parameters, Disorder and
Phase Transitions - NIST Special Publication 846.  Proceedings of the
international conference Accuracy in Powder Diffraction II, held at NIST,
Gaithersburg, MD, May 26-29, 1992 (Issued October, 1992) pg 165-174))
it mentions how when refining these additional parameters how the 
conventional GOF is only slightly changed but that "a much larger effect 
may be obtained, if one uses a weighted Bragg R-factor."

Using the LHPM/REIT7/SR5 software, occassionly when refining subtle 
parameters such as site occupancies or thermal parameters, the R-Wp can 
go down while the R-Bragg goes up.  Are then any comments on this as it 
implies at this level - it would be better to be refining and minimising 
on the weighted R-Bragg, not the weighted profile(?).

Thanks in advance,

Lachlan.

Lachlan Cranswick  - Melbourne, Australia                    _--_|\  
Phone/Fax : (613) 9455-1345                                 /      \
E-mail : [email protected]                              \_.--._/
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Crystallographic WWW : http://www.unige.ch/crystal/stxnews/stx/volnteer.htm 

Date: Thu, 11 Sep 1997 16:54:01 +0200
To: RIETVELD_L Distribution List [[email protected]]
From: "Alan Hewat, ILL Grenoble" [[email protected]]
Subject: Re: RIET: Refining on R-Bragg rather than R-Wp???

 Lachlan Cranswick  wrote 11 Sept 1997:

>Does anyone know the pros and cons of refining of Weighted R-Bragg
>instead of  the Weighted Profile (R-Wp)?  

Yeah, that's what people used to do before Hugo Rietveld invented 
profile refinement.  But if your resolution is so good that you can 
actually MEASURE all the R-Braggs, why not :-)  Otherwise the
extracted integrated intensities (R-Bragg) are biased by the calculated 
structure factors, since the latter are used to obtain the former.

Alan Hewat, ILL Grenoble, FRANCE  tel (33) 4.76.20.72.13 
ftp://ftp.ill.fr/pub/dif  fax (33) 4.76.48.39.06  http://www.ill.fr/dif/

Date: Thu, 11 Sep 1997 17:07:47 +0200
To: RIETVELD_L Distribution List [[email protected]]
From: Armel Le Bail [[email protected]]
Subject: Re: RIET: Refining on R-Bragg rather than R-Wp???

Lachlan wrote :

>Using the LHPM/REIT7/SR5 software, occassionly when refining subtle 
>parameters such as site occupancies or thermal parameters, the R-Wp can 
>go down while the R-Bragg goes up.  Are then any comments on this as it 
>implies at this level - it would be better to be refining and minimising 
>on the weighted R-Bragg, not the weighted profile(?).

If minimizing Rwp, then Icalc and true Iobs are involved. Trying to
minimize R-Bragg, squared Fcalc but not true squared Fobs will be
available (only biased "|Fobs|" depending on Fcalc when there is
overlapping). Consequently I can't see how a refinement based on
minimising R-Bragg could be credible. You should minimize an
expression depending on the really observed data.
Armel

Date: Thu, 11 Sep 1997 11:31:20 -0400
From: "Peter Y. Zavalij" [[email protected]]
Organization: Materials Center, SUNY at Binghamton
To: RIETVELD_L Distribution List [[email protected]]
Subject: Re: RIET: Refining on R-Bragg rather than R-Wp???


>  Lachlan Cranswick [[email protected]] wrote 11 Sept 1997:
>
> >Does anyone know the pros and cons of refining of Weighted R-Bragg
> >instead of  the Weighted Profile (R-Wp)?

> Alan Hewat, ILL Grenoble wrote:

> Yeah, that's what people used to do before Hugo Rietveld invented
> profile refinement.  But if your resolution is so good that you can
> actually MEASURE all the R-Braggs, why not :-)  Otherwise the
> extracted integrated intensities (R-Bragg) are biased by the calculated
> structure factors, since the latter are used to obtain the former.
>
> Alan Hewat, ILL Grenoble, FRANCE  tel (33) 4.76.20.72.13
> ftp://ftp.ill.fr/pub/dif  fax (33) 4.76.48.39.06  http://www.ill.fr/dif/

  Moreover, it is much better than using Rietveld refinement, except of course
you have to get integrated intensities for all or most of reflections. In that
case
it works like single crystal data. Unfortunately it works only in case of simple

unit cell with high symmetry.

--
Dr. Peter Y. Zavalij    University Crystallographer
   Materials Research Center, SUNY at Binghamton
Ph/Fax:(607)777-4623  E-mail:[email protected]
http://imr.chem.binghamton.edu/zavalij/zavalij.html

From: [email protected]
Date: Thu, 11 Sep 1997 9:40:56 -0600 (MDT)
To: [email protected]
Subject: Re: RIET: Refining on R-Bragg rather than R-Wp???

Lachlan wrote :

>Using the LHPM/REIT7/SR5 software, occassionly when refining subtle 
>parameters such as site occupancies or thermal parameters, the R-Wp can 
>go down while the R-Bragg goes up.  Are then any comments on this as it 
>implies at this level - it would be better to be refining and minimising 
>on the weighted R-Bragg, not the weighted profile(?).

As others have said already, this is a somewhat confused question. As a reminder, least 
squares refinement is about matching a set of observations to a comparable set of computed 
values created from some mathematical model. Expressed in this way it is obvious that the 
Bragg reflections are not observations in a powder diffraction pattern. The observations are 
the suite of individual profile intensities obtained as a function of an independent 
"scanning" variable (2-theta, TOF or whatever). The Bragg peaks, on the other hand, are our 
method of modeling the peaky features of a powder diffraction pattern. They have no 
independent existence as observations. Thus, minimization on Fo-Fc makes no sense because 
there are no real Fo's. Those things that are obtained via some extraction procedure during 
a Rietveld refinement are developed by assuming that the Fc's are in the correct ratio; thus 
the "Fo's" are biased by the Fc ratios. And things like R(Bragg) are only useful as probably 
biased diagnostic tools and, most assuredly, not real refinement residuals.
Bob Von Dreele


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